Optical: systems and elements – Diffraction – From grating
Reexamination Certificate
2011-01-04
2011-01-04
Pritchett, Joshua L (Department: 2872)
Optical: systems and elements
Diffraction
From grating
C359S569000, C378S070000
Reexamination Certificate
active
07864426
ABSTRACT:
A method to stabilize planar nanostructures, for example grating and zone plate lenses that are typically used for directing or focusing x-ray radiation, includes the deposition of a top, stabilizing layer. The structures are typically made on a flat substrate, and therefore are only fixed at the bottom. At high aspect ratio, the stability can be poor since small forces such as electrostatic forces and van de Waals forces that are often present can alter the structure. The top coating of a metallic material such as titanium constrains the nanostructures at the top and at the same time eliminates electrostatic forces and reduces any thermal gradient that may be present across the device.
REFERENCES:
patent: 6510200 (2003-01-01), Martynov et al.
patent: 6815363 (2004-11-01), Yun et al.
patent: 2003/0206340 (2003-11-01), Goldstein
patent: 2005/0243423 (2005-11-01), Nakai et al.
patent: 2006/0127830 (2006-06-01), Deng et al.
Feng Yan
Lyon Alan Francis
Yun Wenbing
Houston Eliseeva LLP
Pritchett Joshua L
Xradia, Inc.
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