High and negative voltage compare

Details High and negative voltage compare High and negative voltage compare

1999-02-03

2000-03-07

Nelms, David

Static information storage and retrieval

Read/write circuit

Testing

36518907, 365191, G11C 700

Patent

active

060349069

ABSTRACT:
A voltage of a relatively large potential internal signal in an integrated circuit is tested by providing a comparison signal having a voltage that is lower than the voltage of the relatively large potential internal signal. The voltage of the relatively large potential internal signal is scaled so that the voltage of the scaled internal signal is lower than the voltage of the relatively large potential internal signal. The voltages of the scaled internal signal and the comparison signal are compared. In another form of the invention, a voltage of a negative potential internal signal in an integrated circuit is tested by providing a comparison signal having a voltage higher than the ground potential. The voltage of the negative potential internal signal is converted to a voltage higher than the ground potential. The voltages of the converted internal signal and the comparison signal are compared.

REFERENCES:
patent: 5528173 (1996-06-01), Merritt et al.
patent: 5581206 (1996-12-01), Chevallier et al.
patent: 5615159 (1997-03-01), Roohparvar
patent: 5636166 (1997-06-01), Roohparvar
patent: 5675540 (1997-10-01), Roohparvar
patent: 5677885 (1997-10-01), Roohparvar
patent: 5886935 (1999-03-01), Lakhani et al.

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