Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-05-08
2007-05-08
Do, Thuan V. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
10818844
ABSTRACT:
Performing signal integrity (SI) analysis on integrated circuit designs is becoming increasingly important as these designs increase in size and complexity. Dividing a design into blocks can simplify the resulting analysis. Additionally, such blocks can be replaced with timing models, which provide a compact means of exchanging interface timing information for the blocks. To further increase the speed and accuracy of SI analysis, enhanced interface logic models (SI-ILMs) can be used. An SI-ILM can include cells in timing paths that serve as the interface between the block and other parts of the design. The SI-ILM can also include internal nets that have cross-coupling effects on interface nets and nets outside the block. By including these internal nets, SI analysis at the top-level can be both fast and accurate.
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Daga, Ajay J., et al. “Automated Timing Model Generation” DAC (Jun. 2002) New Orleans, LA, 6 pages.
Bever Hoffman & Harms LLP
Do Thuan V.
Harms Jeanette S.
Levin Naum
Synopsys Inc.
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