Hierarchical 2T-DRAM with self-timed sensing

Static information storage and retrieval – Read/write circuit – Complementing/balancing

Reexamination Certificate

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Details

C365S063000, C365S156000, C365S193000

Reexamination Certificate

active

07460423

ABSTRACT:
An embodiment of the present invention is an array of 2 transistor DRAM cells organized in rows and columns in which the rows represent words and columns represent bits of the words, each bit column having a pair of balanced, true and complement bit lines, the bit lines being connected in a hierarchical bit line structure, comprising at least one local bit line pair and one global bit line pair, a sensing circuit connected to the global bit line pair detects a differential voltage transition on either line during a read access and provides a sensing strobe signal.

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