HF gas etching of wafers in an acid processor

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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134 3, 134 33, 156640, 156646, 156657, 156345, B44C 122, C03C 1500, C03C 2506

Patent

active

049003950

ABSTRACT:
Batch processing of semiconductor wafers utilizing a gas phase etching with anhydrous hydrogen fluoride gas flowing between wafers in a wafer carrier. The etching may take place in a bowl with the wafer carrier mounted on a rotor in the closed bowl. The etchant gas may include a small amount of water vapor, along with the anhydrous hydrogen fluoride gas, as may be needed to commence the etching process. The etching may take place with the wafers arranged in a stack in the wafer carrier and extending along or on the rotation axis.

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patent: 4230515 (1980-10-01), Zajac
patent: 4285800 (1981-08-01), Welty
patent: 4303467 (1981-12-01), Scornavacca et al.
patent: 4609575 (1976-09-01), Burkman
patent: 4682614 (1987-07-01), Silvernail et al.
patent: 4682615 (1987-07-01), Burkman
patent: 4691722 (1987-09-01), Silvernail et al.
patent: 4749440 (1988-07-01), Blackwood et al.
IBM Technical Disclosure Bulletin, vol. 19, No. 7, Dec., 1976 Etching of SiO.sub.2 in Gaseous HF/H.sub.2 O, Authors: K. D. Beyer and M. H. Whitehill.

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