Heterojunction bipolar transistor structure

Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – Bipolar transistor

Reexamination Certificate

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C257S197000, C257SE29188, C257SE29033, C438S312000

Reexamination Certificate

active

10934891

ABSTRACT:
A material made by arranging layers of gallium-arsenide-antimonide (GaAsxSb1-x, 0.0≦x≦1.0) and/or indium-gallium-arsenic-nitride (InyGa1-yAszN1-z, 0.0≦y, z≦1.0) in a specific order is used to form the transistor base of a heterojunction bipolar transistor. By controlling the compositions of the materials indium-gallium-arsenic-nitride and gallium-arsenide-antimonide, and by changing the thickness and order of the layers, the new material would possess a specific energy gap, which in turn determines the base-emitter turn-on voltage of the heterojunction bipolar transistor.

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patent: 5365077 (1994-11-01), Metzger et al.
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patent: 6320212 (2001-11-01), Chow
patent: 6847060 (2005-01-01), Welser et al.
patent: 2003/0213973 (2003-11-01), Yoshioka et al.
patent: 2004/0149994 (2004-08-01), Yi et al.
patent: 2004/0214401 (2004-10-01), Krueger et al.

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