HEMT transistor semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257S646000, C257S192000, C257SE29255, C438S780000

Reexamination Certificate

active

07368793

ABSTRACT:
The semiconductor device of the present invention includes a device formation region formed on a substrate and including at least one semiconductor region, and a first electrode and a second electrode formed spaced apart from each other on the device formation region. A semi-insulating film is formed to cover the surface of a portion of the semiconductor region, which portion is located between the first and second electrodes and in which portion a depletion layer extends when a reverse bias is applied between the first and second electrodes.

REFERENCES:
patent: 2004/0084775 (2004-05-01), Sugino et al.
patent: 2005/0064724 (2005-03-01), Sugino et al.
patent: 2005/0124176 (2005-06-01), Sugino et al.
patent: 2005/0189620 (2005-09-01), Sugino et al.
patent: 2006/0157729 (2006-07-01), Ueno et al.
patent: 2003-115487 (2003-04-01), None

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