Coating apparatus – Gas or vapor deposition – With treating means
Patent
1995-03-28
1996-09-10
Kunemund, Robert
Coating apparatus
Gas or vapor deposition
With treating means
118715, 432241, 432205, C23C 1600
Patent
active
055542263
ABSTRACT:
While the interior of a reaction vessel is being deaerated by a first vacuum pump, an inert gas is supplied from an upstream side (reaction gas bottle side) of a flow rate control unit (MFC) to a reaction gas supply pipe. Thus, a reaction gas is substituted with the inert gas. A passageway downstream of the MFC is closed and the interior of the pipe is deaerated from the upstream side through a bypass pipe so that a predetermined degree of vacuum is obtained. Thus, the gas substituting efficiency can be improved. The interior of the reaction vessel and the interior of the reaction gas supply pipe are quickly deaerated without an influence of resistance of the MFC. The inert gas substitution process and the deaerating process are repeated for 10 cycles or more.
REFERENCES:
patent: 4226208 (1980-10-01), Nishida
patent: 4716852 (1988-01-01), Tsujii
patent: 4717596 (1988-01-01), Barbee
patent: 5069930 (1991-12-01), Hussla
patent: 5091207 (1992-02-01), Tanaka
patent: 5186120 (1993-02-01), Ohnishi
patent: 5190913 (1993-03-01), Higashiyama
patent: 5250323 (1993-10-01), Miyazaki
patent: 5261961 (1993-11-01), Takasu
patent: 5427625 (1995-06-01), Okase
patent: 5458689 (1995-10-01), Saito
Hasei Masaaki
Okase Wataru
Kunemund Robert
Lund Jeffrie R.
Tokyo Electron Kabushiki Kaisha
Tokyo Electron Tohoku Kabushiki Kaisha
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