Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate
Reexamination Certificate
2007-04-12
2010-06-29
Kastler, Scott (Department: 1793)
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
Insulative material deposited upon semiconductive substrate
C266S255000
Reexamination Certificate
active
07745347
ABSTRACT:
An experiment is conducted in advance, for finding a temperature of a cooling plate attained as a result of balancing between a temperature of a substrate after heat treatment and a temperature of the cooling plate at the time of cooling of the substrate. Then, before heat treatment of a first substrate, the cooling plate is moved to a position above a hot plate, the cooling plate is heated to that temperature, and thereafter heat treatment of the substrate is started.
REFERENCES:
patent: 2007/0218706 (2007-09-01), Matsuoka
patent: 2007/0286709 (2007-12-01), Fujii et al.
patent: 2002-93799 (2002-03-01), None
patent: 2003-347305 (2003-12-01), None
Ito Hikaru
Okada Shinji
Yamashita Masami
Kastler Scott
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
Tokyo Electron Limited
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