Static information storage and retrieval – Systems using particular element – Magnetoresistive
Reexamination Certificate
2011-07-12
2011-07-12
Dinh, Son T (Department: 2824)
Static information storage and retrieval
Systems using particular element
Magnetoresistive
C365S171000, C365S173000
Reexamination Certificate
active
07978505
ABSTRACT:
A MRAM structure is described that has a dedicated data storage layer formed between first and second electrodes and a dedicated data sensing layer between second and third electrodes to enable separate read and write functions. A diode between the storage layer and first electrode allows a heating current to flow between first and second electrodes to switch the data storage layer while a field is applied. A second diode between the sensing layer and third electrode enables a sensing current to flow only between second and third electrodes during a read process. Data storage and sensing layers and the three electrodes may be arranged in a vertical stack or the sensing layer, second diode, and third electrode may be shifted between adjacent stacks each containing first and second electrodes, a storage layer, and first diode. Second electrode and the sensing layer may be continuous elements through multiple MRAMs.
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Ackerman Stephen B.
Dinh Son T
Headway Technologies Inc.
Nguyen Nam T
Saile Ackerman LLC
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