Hardmask process for forming a reverse tone image using...

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C430S273100, C430S311000, C430S313000, C430S317000, C430S322000, C430S330000, C430S331000

Reexamination Certificate

active

08084186

ABSTRACT:
The present invention relates to a process for forming an reverse tone image on a device comprising; a) forming an optional absorbing organic underlayer on a substrate; b) forming a coating of a photoresist over the underlayer; c) forming a photoresist pattern; d) forming a polysilazane coating over the photoresist pattern from a polysilazane coating composition, where the polysilazane coating is thicker than the photoresist pattern, and further where the polysilazane coating composition comprises a silicon
itrogen polymer and an organic coating solvent; e) etching the polysilazane coating to remove the polysilazane coating at least up to a level of the top of the photoresist such that the photoresist pattern is revealed; and, f) dry etching to remove the photoresist and the underlayer which is beneath the photoresist, thereby forming an opening beneath where the photoresist pattern was present.The invention further relates to a product of the above process and to a microelectronic device made from using the above process.

REFERENCES:
patent: 4151313 (1979-04-01), Wajima et al.
patent: 4491628 (1985-01-01), Ito et al.
patent: 4770974 (1988-09-01), Hiraoka
patent: 4818611 (1989-04-01), Arai et al.
patent: 4869858 (1989-09-01), Funayama et al.
patent: 4965058 (1990-10-01), Funayama et al.
patent: 4999280 (1991-03-01), Hiraoka
patent: 5292830 (1994-03-01), Funayama et al.
patent: 5350485 (1994-09-01), Shiraishi et al.
patent: 5350660 (1994-09-01), Urano et al.
patent: 5770260 (1998-06-01), Fukuyama et al.
patent: 5770271 (1998-06-01), Imamura
patent: 5843624 (1998-12-01), Houlihan et al.
patent: 5858620 (1999-01-01), Ishibashi et al.
patent: 5863707 (1999-01-01), Lin
patent: 5922411 (1999-07-01), Shimizu et al.
patent: 5976618 (1999-11-01), Fukuyama et al.
patent: 6015650 (2000-01-01), Bae
patent: 6111015 (2000-08-01), Eldin et al.
patent: 6114085 (2000-09-01), Padmanaban et al.
patent: 6221562 (2001-04-01), Boyd et al.
patent: 6303524 (2001-10-01), Sharangpani et al.
patent: 6447980 (2002-09-01), Rahman et al.
patent: 6686124 (2004-02-01), Angelopoulos et al.
patent: 6723488 (2004-04-01), Kudo et al.
patent: 6737492 (2004-05-01), Kang et al.
patent: 6767641 (2004-07-01), Shimizu et al.
patent: 6780569 (2004-08-01), Hudson et al.
patent: 6790587 (2004-09-01), Feiring et al.
patent: 6818258 (2004-11-01), Kaneko et al.
patent: 6849377 (2005-02-01), Feiring et al.
patent: 6866984 (2005-03-01), Jung et al.
patent: 6916590 (2005-07-01), Kaneko et al.
patent: 6995056 (2006-02-01), Lee et al.
patent: 7015144 (2006-03-01), Hong et al.
patent: 7053005 (2006-05-01), Lee et al.
patent: 7125926 (2006-10-01), Satoh et al.
patent: 7179537 (2007-02-01), Lee et al.
patent: 7344603 (2008-03-01), Shimizu et al.
patent: 7521170 (2009-04-01), Rahman et al.
patent: 7528200 (2009-05-01), Schile
patent: 7704670 (2010-04-01), Abdallah et al.
patent: 2001/0036593 (2001-11-01), Takeda et al.
patent: 2002/0028408 (2002-03-01), Mao et al.
patent: 2002/0045125 (2002-04-01), Shao et al.
patent: 2002/0064936 (2002-05-01), Park et al.
patent: 2002/0128410 (2002-09-01), Jung et al.
patent: 2002/0137826 (2002-09-01), Jung et al.
patent: 2002/0142246 (2002-10-01), Gronbeck et al.
patent: 2002/0156148 (2002-10-01), Arase et al.
patent: 2003/0204035 (2003-10-01), De et al.
patent: 2003/0220431 (2003-11-01), Xu et al.
patent: 2004/0023156 (2004-02-01), McGinness et al.
patent: 2004/0048761 (2004-03-01), Ikemoto
patent: 2004/0067441 (2004-04-01), Shao et al.
patent: 2004/0102048 (2004-05-01), Yamaguchi
patent: 2004/0110089 (2004-06-01), Neef et al.
patent: 2004/0209200 (2004-10-01), Wayton et al.
patent: 2005/0069814 (2005-03-01), Endo et al.
patent: 2005/0164133 (2005-07-01), Rangarajan et al.
patent: 2005/0277058 (2005-12-01), Iwabuchi et al.
patent: 2006/0228895 (2006-10-01), Chae et al.
patent: 2007/0048670 (2007-03-01), Choi et al.
patent: 2007/0179257 (2007-08-01), Schile
patent: 2007/0298349 (2007-12-01), Zhang et al.
patent: 2008/0020328 (2008-01-01), Suggeta et al.
patent: 2008/0160459 (2008-07-01), Lin
patent: 2008/0166665 (2008-07-01), Jung
patent: 2008/0193880 (2008-08-01), Nishibe et al.
patent: 2008/0196626 (2008-08-01), Wu et al.
patent: 2008/0199814 (2008-08-01), Brzozowy et al.
patent: 2008/0248427 (2008-10-01), Thiyagarajan et al.
patent: 2008/0292995 (2008-11-01), Houlihan et al.
patent: 2009/0011374 (2009-01-01), Change et al.
patent: 2009/0029191 (2009-01-01), Albrecht
patent: 2009/0042148 (2009-02-01), Padmanaban et al.
patent: 2009/0081379 (2009-03-01), Nawrocki et al.
patent: 2009/0123701 (2009-05-01), Fu et al.
patent: 2009/0142701 (2009-06-01), Hsu et al.
patent: 2009/0246691 (2009-10-01), Rahman et al.
patent: 2009/0253080 (2009-10-01), Dammel et al.
patent: 2009/0253081 (2009-10-01), Abdallah et al.
patent: 2009/0258318 (2009-10-01), Chan
patent: 2009/0280435 (2009-11-01), McKenzie et al.
patent: 2010/0035177 (2010-02-01), Ishikawa et al.
patent: 2010/0040838 (2010-02-01), Abdallah et al.
patent: 2010/0119717 (2010-05-01), Hong et al.
patent: 2010/0130016 (2010-05-01), DeVilliers
patent: 2010/0183851 (2010-07-01), Cao et al.
patent: 2010/0308015 (2010-12-01), Takano et al.
patent: 1164435 (2001-12-01), None
patent: 2 128 706 (2009-12-01), None
patent: 2-5522 (1990-01-01), None
patent: 5-13384 (1993-01-01), None
patent: 6-216084 (1994-08-01), None
patent: 7-130631 (1995-05-01), None
patent: 2000181069 (2000-06-01), None
patent: 2003-31486 (2003-01-01), None
patent: 2009-25815 (2009-02-01), None
patent: WO 2008/059440 (2008-05-01), None
Form PCT/ISA/220, Form PCT/ISA/210, and Form PCT/ISA/237 mailed Feb. 19, 2010 for PCT/IB2009/005143, which corresponds to U.S. Appl. No. 12/356,568.
Masafumi Hori et al, “Sub-40nm Half-Pitch Double Patterning with Resist Freezing Process”, SPIE vol. 6923, 69230H, pp. 69230H-1-pp. 69230H-8 (2008) XP-002565387.
Shun-Ichi Kodama et al., “Synthesis of Novel Fluoropolymer for 157nm Photoresists by Cyclo-polymerization”, SPIE vol. 4690, pp. 76-pp. 83 (2002).
M. Maenhoudt et al., “Alternative process schemes for double patterning that eliminate the intermediate etch step”, SPIE vol. 6974, 69740P, pp. 69240P-1-pp. 69249P-12 (2008) XP-002565388.
A. Valeenhove et al., “A litho-only approach to double patterning”, SPIE vol. 6520, 65202F, pp. 65202F-1-pp. 65202F-10 (2007) XP-002565386.
Notification of Transmittal of the International Search Report and the Written Opinion of the International Searching Authority, or the Declaration (Form PCT/ISA/220), International Search Report (Form PCT/ISA/210), and Written Opinion of the International Searching Authority (Form PCT/ISA/237) for PCT/IB2009/005170 mailed Jul. 28, 2009, which corresponds to U.S. Appl. No. 12/061,061.
International Search Report (Form PCT/ISA/210), and Written Opinion of the International Searching Authority (Form PCT/ISA/237) for PCT/IB2009/005172 mailed Jul. 8, 2009, which corresponds to U.S. Appl. No. 12/061,111.
Notification of Transmittal of the International Search Report and the Written Opinion of the International Searching Authority, or the Declaration (Form PCT/ISA/220), International Search Report (Form PCT/ISA/210), and Written Opinion of the International Searching Authority (Form PCT/ISA/237) for PCT/IB2009/005146 mailed Jul. 15, 2009, which corresponds to U.S. Appl. No. 12/192,621.
David J. Abdallah et al., “A Novel Resist Freeze Process for Double Imaging”, Journal of Photopolymer Science and Technology, (2008), pp. 655-pp. 663, vol. 21, No. 5, XP002533190.
Form PCT/ISA/220, Form PCT/ISA/210, and Form PCT/ISA/237 for PCT/IB2009/005145 dated Oct. 19, 2009, which corresponds to U.S. Appl. No. 12/368,720.
Office Action dated. Sep. 23, 2010 for U.S. Appl. No. 12/061,061.
Form PCT/IB/326, Form PCT/IB/373, and Form PCT/ISA/237 for PCT/IB2009/005170 dated Oct. 14, 2010, which corresponds to U.S. Appl. No. 12/061,061.
Form PCT/IB/326, Form PCT/IB/373, and Form PCT/ISA/237 for PCT/IB2009/005172 dated Oct. 14, 2010, which corresponds to U.S. Appl. No. 12/061,111.
Office Action dated Oct. 28, 2010 for U.S. Appl. No. 12/192,621.
Off

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Hardmask process for forming a reverse tone image using... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Hardmask process for forming a reverse tone image using..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Hardmask process for forming a reverse tone image using... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4267448

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.