Handling device

Details Handling device Handling device

1996-05-13

1998-11-03

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

G01R 3122

Patent

active

058314423

ABSTRACT:
A handling device, in particular for handling probes of a wafer testing device, includes a receiving device for a probe being disposed in such a way as to be adjustable in a vertical direction and in a horizontal direction relative to at least one vertical bearer. The receiving device is guided adjustably in a horizontal direction on a supporting part. The supporting part is guided adjustably in a vertical direction on the at least one vertical bearer. Furthermore, a counterweight device is constructed so as to counterbalance the weight of the probe, the receiving device and the supporting part. The counterweight device includes a carrying device for receiving counterbalance weights. The carrying device is aligned horizontally and for parallel motion includes at least three suspension devices for fixing a connector which is turned round associated guide pulleys and is connected to the supporting part.

REFERENCES:
patent: 4383217 (1983-05-01), Shiell
patent: 4527942 (1985-07-01), Smith
patent: 4588346 (1986-05-01), Smith
patent: 4875005 (1989-10-01), Terada et al.
patent: 4979093 (1990-12-01), Laine et al.

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