Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-09-25
2008-11-25
Hollington, Jermele M (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07456642
ABSTRACT:
A test probe assembly includes a probe-supporting component and a test probe on it. According to one aspect of the invention, the probe-supporting component takes the form of a probe-supporting housing in which the test probe is partially disposed so that two test probe legs extend out of the housing to spaced-apart distal end portions of the legs, with the housing enhancing leg stability and limiting leg contact for less stray-impedance influence on test results when a user holds the housing and squeezes the distal end portions toward terminals on a device under test (DUT). According to another aspect, at least one of the distal end portions includes a terminal-contacting electrode having at least two electrically conductive elements for contacting a terminal on the DUT, each electrically conductive element being moveable to and from the terminal independent of the other element for multi-point contact (MPC) purposes resulting in reduced effective serial resistance (ESR) and enabling true Kelvin-type measurements. The legs are preferably composed of a plurality of thin, flat, laser-machined layers, and one alternate embodiment includes at least three terminal-contacting electrodes for use with a three-terminal DUT.
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Agilent 16334A Test Fixture Operation and Service Manual; Second Edition; published Dec. 1999 by Agilent Technologies, Agilent Part No. 16334-90000.
Gasque James G.
Saulnier Christian R.
Ceramic Component Technologies, Inc.
Hanson Loyal McKinley
Hollington Jermele M
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