Hacking detector circuit for semiconductor integrated...

Details Hacking detector circuit for semiconductor integrated... Hacking detector circuit for semiconductor integrated...

2011-04-26

2011-04-26

Nguyen, Hoai-An D (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

C713S194000, C726S023000

Reexamination Certificate

active

07932725

ABSTRACT:
Disclosed is a semiconductor integrated circuit which includes a pre-charge capacitor connected to a check node pre-charged. A sense capacitor is configured to discharge the check node. A detector is configured to detect whether the sense capacitor is exposed, based upon a voltage of the check node after a predetermined length of time has elapsed.

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English Abstract for Publication No. 100198617 (for 1997-0051249).
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English Abstract for Publication No. 62-288990.

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