Active solid-state devices (e.g. – transistors – solid-state diode – With means to increase breakdown voltage threshold – In integrated circuit
Reexamination Certificate
2008-09-30
2010-11-02
Pham, Thanh V (Department: 2894)
Active solid-state devices (e.g., transistors, solid-state diode
With means to increase breakdown voltage threshold
In integrated circuit
C257S487000
Reexamination Certificate
active
07825487
ABSTRACT:
A guard ring structure for use in a semiconductor device. The guard ring structure includes a semiconductor layer stack having a first layer and a second layer on top of the first layer, gates structures formed in the first layer; and guard rings formed in the first layer. The second layer has a dopant concentration that is higher than the dopant concentration of the first layer. The gates and the guard rings are formed simultaneously using a single mask.
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patent: 2007/0096172 (2007-05-01), Tihanyi et al.
Snook Megan J.
Veliadis John Victor D.
Andrews & Kurth LLP
Fernandes Errol
Northrop Grumman Systems Corporation
Pham Thanh V
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