Semiconductor device manufacturing: process – Chemical etching – Combined with coating step
Patent
1998-03-09
2000-05-09
Utech, Benjamin L.
Semiconductor device manufacturing: process
Chemical etching
Combined with coating step
438700, 438703, 438735, H01L 21311
Patent
active
060603984
ABSTRACT:
A method and apparatus for protecting a neighboring area that is adjacent to a first area that is to be etched. The method includes creating a guard cell substantially surrounding the first area, but excluding the neighboring area. The guard cell is formed of a material that is substantially selective to the etch process subsequently employed to etch within the first area. After the guard cell is formed, an etch is performed within the first area, while the guard cell prevents etching of the neighboring are outside the guard cell.
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Wolf,S., Silicon Processing for the VLSI Era, vol. 2--Process Integration, Lattice Press, Sunset Beach, California, 1990, pp. 35-36.
Brintzinger Axel Christoph
Ramachandran Ravikumar
Srinivasan Senthil Kumar
Anderson Matthew
Braden Stanton C.
Siemens Aktiengesellschaft
Utech Benjamin L.
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