Growth of planar reduced dislocation density m -plane...

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – On insulating substrate or layer

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S479000, C257SE21097

Reexamination Certificate

active

11140893

ABSTRACT:
A method of growing highly planar, fully transparent and specular m-plane gallium nitride (GaN) films. The method provides for a significant reduction in structural defect densities via a lateral overgrowth technique. High quality, uniform, thick m-plane GaN films are produced for use as substrates for polarization-free device growth.

REFERENCES:
patent: 5926726 (1999-07-01), Bour et al.
patent: 6051849 (2000-04-01), Davis et al.
patent: 6153010 (2000-11-01), Kiyoku et al.
patent: 6156581 (2000-12-01), Vaudo et al.
patent: 6177057 (2001-01-01), Purdy
patent: 6177292 (2001-01-01), Hong et al.
patent: 6180270 (2001-01-01), Cole et al.
patent: 6268621 (2001-07-01), Emmi et al.
patent: 6350666 (2002-02-01), Kryliouk
patent: 6413627 (2002-07-01), Motoki et al.
patent: 6441391 (2002-08-01), Ohno et al.
patent: 6468882 (2002-10-01), Motoki et al.
patent: 6582986 (2003-06-01), Kong et al.
patent: 6586316 (2003-07-01), Tsuda et al.
patent: 6602763 (2003-08-01), Davis et al.
patent: 6623560 (2003-09-01), Biwa et al.
patent: 6635901 (2003-10-01), Sawaki et al.
patent: 6645295 (2003-11-01), Koike et al.
patent: 6900070 (2005-05-01), Craven et al.
patent: 2001/0029086 (2001-10-01), Ogawa et al.
patent: 2002/0047113 (2002-04-01), Ohno et al.
patent: 2003/0114017 (2003-06-01), Wong et al.
patent: 2004/0108513 (2004-06-01), Narukawa et al.
patent: 0 942 459 (1999-09-01), None
patent: 2001 257166 (2001-09-01), None
patent: 2002 076329 (2002-03-01), None
patent: 2002 076521 (2002-03-01), None
patent: WO 2004/061909 (2004-07-01), None
patent: WO 2004/061969 (2004-07-01), None
patent: WO 2005/064643 (2005-07-01), None
Aujol et al, “Hydrogen and Nitrogen Ambient Effects on Epitaxial Growth of GaN by Hydride Vapour Phase Epitaxy”, Journal of Crystal Growth, 2001, 230. Pages 372-376.
Waltereit et al, “M-Plane GaN (1100) Grown on g-LiAlO2 (100): Nitride Semiconductors Free of Internal Electrostatic Fields”, Journal Of Crystal Growth, 2001, 227-228. Pages 437-441.
Wang, F. et al., “Crystal Tilting in the Epitaxial Laterally Overgrown GaN Films on Sapphire Substrate by Hydride Vapor Phase Epitaxy”, Solid State and Integrated-Circuit Technology Proceedings, 6thInternational Conference, Oct. 2001, vol. 2, pp. 1998-1201.
Maruska, H.P. et al., “Development of 50 mm Diameter Non-Polar Gallium Nitride Substrates for Device Applications”, International Conference on Indium Phosphide and Related Materials, May 16, 2003, pp. 567-570.
Craven, M.D., et al., “Structural characterization of nonpolar (1120) α-plane GaN thin films grown on (1102)r-plane sapphire”, Applied Physics Letters, vol. 81, No. 3, Jul. 15, 2002, pp. 469-471, XP002250684.
Dupuis, R.D., et al., “Selective-area and lateral epitaxial overgrowth of III-N materials by metalorganic chemical vapor deposition”, Journal of Crystal Growth, vol. 195, No. 1-4, Dec. 15, 1998, pp. 340-345, XP004154285.
Grzegory, I., et al., “Seeded growth of GaN at high N2pressure on (0 0 0 1) polar surfaces of GaN single crystalline substrates”, Materials Science in Semiconductor Processing, vol. 4, No. 6, Dec. 2001, pp. 535-541, XP004345737.
Liu, L. et al., “Substrates for gallium nitride epitaxy”, Materials Science and Engineering R, Reports: A Review Journal, vol. 37, No. 3, Apr. 30, 2002, pp. 61-127, XP004349792.
Marchand, H., et al., “Mechanisms of lateral epitaxial overgrowth of gallium nitride by metalorganic chemical vapor deposition”, Journal of Crystal Growth, vol. 195, No. 1-4, Dec. 15, 1998, pp. 328-332, XP004154283.
Mills, Alan, “Wide-bandgap emitters continue to improve”, III-Vs Review, vol. 13, No. 3, May 2000, pp. 23-24, 26, 28-30, XP004200697.
Sasaki, T., et al., “Substrate-orientation dependence of GaN single-crystal films grown by metalorganic vapor-phase epitaxy”, Journal of Applied Physics, American Institute of Physics, vol. 61, No. 7, Apr. 1, 1987, pp. 2533-2540, XP000820119.
Sun, Chien-Jen, et al., “Comparison of the physical properties of GaN thin films deposited on (0001) and (0112) sapphire substrates”, Applied Physics Letters, vol. 63, No. 7, 1993, pp. 973-975, XP002251480.
Amano, H., et. al., “Metalorganic vapor phase epitaxial growth of a high quality GaN film using an AIN buffer layer” Appl. Phys. Lett. 48 (5), Feb. 3, 1986, pp. 353-355.
Ambacher, O., et. al., “Two-dimensional electron gases induced by spontaneous and piezoelectric polarization charges in N- and Ga-face AlGaN/GaN heterostructures” J. Appl. Phys., 85 (6), Mar. 15, 1999, pp. 3222-3233.
Bottcher, T., et al., “The role of high-temperature island coalescence in the development of stresses in GaN films” Appl. Phys. Lett. 78 (14), Apr. 2, 2001, pp. 1976-1978.
Brandt, O., et al., “Determination of strain state and composition of highly mismatched group-III nitride heterostructures by x-ray diffraction” J. Phys. D. Appl. Phys. 35 (2002), pp. 577-585.
Craven, M.D., et al., “Characterization of a-Plane GaN/(Al3Ga)N Multiple Quantum Wells Grown via Metalorganic Chemical Vapor Deposition” Jpn. J. Appl. Phys. vol. 42, (2003), pp. L235-L238.
Craven, M.D., et al., “Threading dislocation reduction via laterally overgrown nonpolar (1120) a-plane GaN” Appl. Phys. Lett. 81 (7), Aug. 12, 2002, pp. 1201-1203.
Dovidenko, K., et. al., Characteristics of stacking faults in AIN thin films J. Appl. Phys. 82 (9), Nov. 1, 1997, pp. 4296-4299.
Eastman, L.F., “The Toughest Transistor Yet” IEEE Spectrum 39 (5), May 2002, pp. 28-33.
Eddy, C.R., Jr., “Growth of gallium nitride thins films by electron cyclotron resonance microwave plasma-assisted molecular beam epitaxy” J. Appl. Phys. 73 (1), Jan. 1, 1993, pp. 448-455.
Etzkorn, E.V., et al., “Cracking of GaN films” J. Appl. Phys. 89 (2), Jan. 15, 2001, pp. 1025-1034.
Freitas, J. A., Jr., et al., “Optical characterization of lateral epitaxial overgrown GaN layers” Appl. Phys. Lett. 72 (23), Jun. 8, 1998, pp. 2990-2992.
Grandjean, N., et al., “Built-in electric-field effects in wurtzite AlGaN quantum wells” J. Appl. Phys. 86 (7), Oct. 1, 1999, pp. 3714-3720.
Heying, B., et al., “Role of threading dislocation structure on the x-ray diffraction peak widths in epitaxial GaN films” Appl. Phys. Lett. 68 (5), Jan. 29, 1996, pp. 643-645.
I. J. Seo, et. al., “Reduction of oscillator strength due to piezoelectric fields in GaN/AlxGa1−xN quantum wells” Phys. Rev. B. 57 (16), Apr. 15, 1998-II, pp. R9435-R9438.
Iwata, K., et. al., “Gas Source Molecular Beam Epitaxy Growth of GaN on C−, A−, R−, and M−Plane Sapphire and Silica Glass Substrates” Jpn. J. Appl. Phys. vol. 36 (1997), pp. L 661-L664.
Kapolnek, D., et al., “Anisotropic epitaxial lateral growth in GaN selective area epitaxy” Appl. Phys. Lett. 71 (9), Sep. 1, 1997, pp. 1204-1206.
Langer, R., et. al., “Giant electric fields in unstrained GaN single quantum wells” Appl. Phys. Lett., 74 (25), Jun. 21, 1999, pp. 3827-3829.
Lefebvre, P. et al., “High internal electric field in a graded-width InGaN/GaN quantum well: Accurate determination by time-resolved photoluminescence spectroscopy” Appl. Phys. Lett. 78 (9), Feb. 26, 2001, pp. 1252-1254.
Lefebvre, P., et al., “Time-resolved photoluminescence as a probe of internal electric fields in GaN-(GaAl)N quantum wells” Phys. Rev. B. 59 (23), Jun. 15, 1999-I, pp. 15363-15367.
Lei, T., “Heteroepitaxy, polymorphism, and faulting in GaN thin films on silicon and sapphire substrates” J. Appl. Phys. 74 (7), Oct. 1, 1993, pp. 4430-4437.
Leroux, M., “Barrier-width dependence of group-III nitrides quantum-well transition energies” Phys. Rev. B. 60 (3), Jul. 15, 1991-I, pp. 1496-1499.
Leszczynski, M., et. al., “Lattice parameters of gallium nitride” Appl. Phys. Lett. 69 (1), Jul. 1, 1996, pp. 73

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Growth of planar reduced dislocation density m -plane... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Growth of planar reduced dislocation density m -plane..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Growth of planar reduced dislocation density m -plane... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3741970

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.