Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal
Reexamination Certificate
2011-03-08
2011-03-08
Arora, Ajay K (Department: 2892)
Semiconductor device manufacturing: process
Making device or circuit emissive of nonelectrical signal
C438S037000, C257S097000, C257S102000, C257S103000
Reexamination Certificate
active
07901960
ABSTRACT:
A group III nitride substrate on which an epitaxially grown layer of good quality can be formed, and a method of manufacturing the same are obtained. A GaN substrate is one of the following: a group III nitride substrate, wherein the number of atoms of an acid material per square centimeter of a surface is not more than 2×1014, and the number of silicon atoms per square centimeter of the surface is not more than 3×1013; a group III nitride substrate, wherein the number of silicon atoms per square centimeter of a surface is not more than 3×1013, and a haze level of the surface is not more than 5 ppm; and a group III nitride substrate, wherein the number of atoms of an acid, material per square centimeter of a surface is not more than 2×1014, and a haze level of the surface is not more than 5 ppm.
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Hachigo Akihiro
Irikura Masato
Ishibashi Keiji
Nakahata Seiji
Arora Ajay K
Drinker Biddle & Reath LLP
Sumitomo Electric Industries Ltd.
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