Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-07-11
2006-07-11
Parker, Kenneth (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S347000, C257S350000, C257SE27112, C257SE21320, C257SE21561, C257SE21564
Reexamination Certificate
active
07075153
ABSTRACT:
A semiconductor memory device comprising: an SOI substrate having a thin silicon layer on top of a buried insulator; and an SRAM comprising four NFETs and two PFETs located in the thin silicon layer, each the NFET and PFET having a body region between a source region and a drain region, wherein the bodies of two of the NFETs are electrically connected to ground. Additionally, the bodies of the two PFETs are electrically connected to VDD.
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Assaderaghi Fariborz
Bryant Andres
Cottrell Peter E.
Gauthier Jr. Robert J.
Mann Randy W.
Canale Anthony
Fenty Jesse A.
Parker Kenneth
Schmeiser Olsen & Watts
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