Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-02-01
2010-10-05
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
Reexamination Certificate
active
07810063
ABSTRACT:
According to various embodiments of the invention electronic circuit design information can be presented to a designer by determining an electronic circuit comprising at least two gates and by determining a distance of one gate relative to another gate in a stage. A visual indicator for the stage can be calculated based on the distances between at least two gates in the stage. The visual indicator can then be displayed. The visual indicator can be a color and the relative distance can be indicated by brightness, hue or saturation, etc. Alternatively, the visual indicator can be a pattern and the relative distance between at least two gates can be indicated by darkness of the pattern.
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patent: 5850349 (1998-12-01), Hirai et al.
patent: 7234125 (2007-06-01), Scott et al.
patent: 2002/0162080 (2002-10-01), Takahashi et al.
patent: 2003/0226126 (2003-12-01), Iwai et al.
patent: 2005/0034091 (2005-02-01), Harn
patent: 2005/0138590 (2005-06-01), Amundson et al.
Bhushan Bharat
Kommoori Srinivas R.
Lee Po-chiang Albert
Parui Mithunjoy
Sharma Harsh Dev
Cadence Design Systems Inc.
Lin Aric
Sheppard Mullin Richter & Hampton LLP
Siek Vuthe
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