Graphical system and automated pattern generator for testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Reexamination Certificate

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07017088

ABSTRACT:
A method of generating a test vector pattern for an array, including determining a failure of a test of the array, defining a type of test vector pattern to generate using a graphical user interface, generating the test vector pattern, and testing the array using the test vector pattern. A test vector pattern generation tool, including an array, a test vector pattern, and a graphical user interface generating the test vector pattern. The array is tested using the custom test vector pattern.

REFERENCES:
patent: 5644581 (1997-07-01), Wu
patent: 6601205 (2003-07-01), Lehmann et al.

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