Grain probe

Measuring and testing – Sampler – sample handling – etc. – Capture device

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

7386464, 374155, 374157, G01N 112, G01N 108, G01K 1312, G01K 1302

Patent

active

048669970

ABSTRACT:
A grain probe for sampling and measuring the physical characteristics of stored grain in situ. The probe has a telescopic shaft with a meter fixedly attached to one end thereof and a novel grain probe tip fixedly attached to the opposite end thereof, a grain receiving chamber within the tip, an environmental measuring element is affixed within the grain receiving chamber and is directly coupled to a readout meter; and there is provided a novel mechanism for automatically closing the grain receiving chamber to grain kernels while the probe tip is being inserted into stored grain and automatically opening the grain receiving chamber to grain kernels for sampling and direct contact with the environmental measuring element to provide instantaneous physical characteristic information as the probe tip is slightly withdrawn from the stored grain.

REFERENCES:
patent: 646217 (1900-03-01), Hollingsworth
patent: 1072644 (1913-09-01), Peck
patent: 2184472 (1939-12-01), Sand
patent: 2331227 (1943-10-01), Proudlock
patent: 2523691 (1950-09-01), Fitch
patent: 3153344 (1964-10-01), Lawrence et al.
patent: 3192773 (1965-07-01), Wilson
patent: 3199353 (1965-08-01), Burnight
patent: 4044607 (1977-08-01), Deal
patent: 4072059 (1978-02-01), Hamilton
patent: 4179930 (1979-12-01), Chrisp
patent: 4248089 (1981-02-01), Heinmets
patent: 4283946 (1981-08-01), Bowser et al.
patent: 4399404 (1983-08-01), Resh
patent: 4790198 (1988-12-01), Awtry
Delmhorst Instrument Company, Boonton, N.J., Electric Thermometer, Model TM-2B, Rel. 6413-983 (article); 2 pages.
Seedburo Equipment Company, Chicago, Illinois, catalog pp. 27-30, both published by Dec. 1987.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Grain probe does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Grain probe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Grain probe will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-360575

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.