Graded channel field effect transistor

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

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257365, 257616, 257655, H01L 2712

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active

057773645

ABSTRACT:
A MISFET having a graded semiconductor alloy channel layer of silicon germanium in which the germanium is graded to a single peak percentage level. The single peak percentage level defines the location of the charge carriers within the layer. The transconductance of the device can be optimized by controlling the location of the carriers within the channel.

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Lang et al., "Measurement of Band Gap of Ge.sub.x Si.sub.1-x /Si Strained-Layer Heterostructures," Appl Phys. Let., vol. 47, No. 12 Dec. 15, 1985.
Taft et al., "Fabrication of a p-channel BICFET in the Ge.sub.x Si.sub.1-x /Si System," IEDM, pp. 570-573, 1988.
E. Kasper, "Growth and Properties of Si/SiGe Superlattices," Surface Science, vol. 174 pp. 630-639, 1986.

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