Gold/silicon eutectic die bonding method

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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Details

C438S118000, C438S406000, C438S459000, C257SE21514, C257SE21596

Reexamination Certificate

active

07659191

ABSTRACT:
A direct gold/silicon eutectic die bonding method is disclosed. The method includes the steps of gold plating a die bonding pad, grinding a wafer to a desired thickness, dicing the wafer after the grinding step, picking a die, and attaching the die to the die bonding pad at a temperature above the gold/silicon eutectic temperature. For thinner wafers, a dicing before grinding process is employed.

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patent: 6376910 (2002-04-01), Munoz et al.
patent: 6939778 (2005-09-01), Harpster et al.
patent: 7598588 (2009-10-01), Davies

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