Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis
Reexamination Certificate
2005-02-22
2005-02-22
Assouad, Patrick (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Chemical analysis
C700S266000
Reexamination Certificate
active
06859739
ABSTRACT:
An improved empirical model-based surveillance or control system for monitoring or controlling a process or machine provides identification of transitions between operational states. Empirical model-based estimates generated in response to receiving actual operational parameters are compared using a global similarity operator to the actual parameters to indicate whether the process or machine is operating in a stable state, or is in transition from one state to another.
REFERENCES:
patent: 3045221 (1962-07-01), Roop
patent: RE31750 (1984-11-01), Morrow
patent: 4517468 (1985-05-01), Kemper et al.
patent: 5109700 (1992-05-01), Hicho
patent: 5586066 (1996-12-01), White et al.
patent: 5610339 (1997-03-01), Haseley et al.
patent: 5689434 (1997-11-01), Tambini et al.
patent: 5710723 (1998-01-01), Hoth et al.
patent: 5774379 (1998-06-01), Gross et al.
patent: 5808903 (1998-09-01), Schiltz et al.
patent: 5842157 (1998-11-01), Wehhofer et al.
patent: 5917428 (1999-06-01), Discenzo et al.
patent: 5943634 (1999-08-01), Piety et al.
patent: 5987399 (1999-11-01), Wegerich et al.
patent: 6041287 (2000-03-01), Dister et al.
patent: 6567752 (2003-05-01), Cusumano et al.
patent: 6591166 (2003-07-01), Millett et al.
patent: 6591296 (2003-07-01), Ghanime
patent: 6609212 (2003-08-01), Smith
patent: 6678639 (2004-01-01), Little et al.
patent: WO 0067412 (2000-11-01), None
“Application Of A New Technique For Modeling System Behavior” by Paul J. O'Sullivan, presented at the ISA Symposium, Edmonton, Alberta, May 1, 1991, © Copyright 1991 Instrument Society of America (21 pp.).
“A Universal, Fault-Tolerant, Non-Linear Analytic Network For Modeling And Fault Detection,” by J. E. Mott, R. W. King, L. R. Monson, D. L. Olson, and J. D. Staffon, Proceedings of the 8th Power Plant Dynamics, Control & Testing Symposium, Knoxville, Tennessee, May 27-29, 1992 (14 pp.).
ModelWare™ Product Review by Robert D. Flori, reprinted from Computerized Investing, Sep./Oct. 1992, vol. XI, No. 5, copyright by The American Association of Individual Investors (pp. 8-10).
ModelWare™ A New Approach to Prediction by Ken Tucker, reprinted from PC Al magazine, Jan./Feb. 1993, pp. 14, 15, 30.
“Similarity Based Regression: Applied Advanced Pattern Recognition for Power Plant Analysis,” by E. J. Hansen and M. B. Caudill, presented at the 1994 EPRI Heat Rate Improvement Conference (9 pp.).
“Applied Pattern Recognition For Plant Monitoring And Data Validation,” by Ron Griebenow, E. J. Hansen, and A. L. Sudduth, presented at the Fifth International Joint ISA POWID/EPRI Controls and Instrumentation Conference, La Jolla, California, Jun. 19-21, 1995 (11 pp.).
“Model-Based Nuclear Power Plant Monitoring And Fault Detection: Theoretical Foundations,” by Ralph M. Singer, Kenny C. Gross, James P. Herzog, Ronald W. King, and Stephan Wegerich, presented at the International Conference on Intelligent System Application to Power Systems (ISAP '97), Jul. 6-10, 1997, Seoul, Korea (pp. 60-65).
“Application Of A Model-Based Fault Detection System To Nuclear Plant Signals,” by K. C. Gross, R. M. Singer, S. W. Wegerich, J. P. Herzog, R. VanAlstine, and F. Bockhorst, presented at the International Conference on Intelligent System Application to Power Systems (ISAP '97), Jul. 6-10, 1997, Seoul, Korea (pp. 66-70).
“MSET Modeling Of Crystal River-3 Venturi Flow Meters” by J. P. Herzog, S. W. Wegerich, K. C. Gross, and F. K. Bockhorst, 6th International Conference on Nuclear Engineering, ICONE-6169, May 10-14, 1998, Copyright © 1998 ASME (12 pp).
Bell David R.
Wegerich Stephan W.
Xu Xiao
Assouad Patrick
Fitch Even Tabin & Flannery
Miller Craig Steven
Smartsignal Corporation
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