Global planarization process using patterned oxide

Fishing – trapping – and vermin destroying

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

437195, H01L 21465

Patent

active

055082335

ABSTRACT:
A method for planarizing the surface of a layer in a semiconductor device includes forming conductor regions 24, 26, and 28 on a layer of the semiconductor device; forming first insulator regions 30, 32, and 34 in gaps between the conductor regions 24, 26, and 28; and forming an insulator layer 40 over the first insulator regions 30, 32, and 34, and over the conductor regions 24, 26, and 28 such that a surface of the insulator layer 40 will be substantially planar.

REFERENCES:
patent: 5192715 (1993-03-01), Sliwa et al.
patent: 5296092 (1994-03-01), Kim

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Global planarization process using patterned oxide does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Global planarization process using patterned oxide, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Global planarization process using patterned oxide will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-324985

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.