Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate
2006-10-24
2006-10-24
Williams, Hezron (Department: 2856)
Measuring and testing
Surface and cutting edge testing
Roughness
C073S001810, C073S001890, C073S104000, C324S212000
Reexamination Certificate
active
07124625
ABSTRACT:
A glide-height disk-tester operates with the test disk rotating at a predetermined constant rotational speed and uses a glide head with an electrically-resistive heater and a thermally-responsive protrusion pad located on its trailing end. The linear velocity of the disk relative to the slider maintains the slider at its nominal fly height, which is typically higher than any expected asperity. With no current applied to the heater, the protrusion pad is generally flush with the air-bearing surface of the slider. Increasing levels of current are applied to the heater, which causes movement of the protrusion pad toward the disk surface. When the pad contacts an asperity, the current level applied at the instant of asperity contact is recorded. The applied current level can be correlated to the glide height from a previous calibration process using a calibration disk with known calibration bump heights.
REFERENCES:
patent: 5805284 (1998-09-01), Lacey
patent: 5825181 (1998-10-01), Schaenzer et al.
patent: 5956217 (1999-09-01), Xuan et al.
patent: 5991113 (1999-11-01), Meyer et al.
patent: 6003364 (1999-12-01), Yao et al.
patent: 6016692 (2000-01-01), Schaenzer et al.
patent: 6023963 (2000-02-01), Schaenzer et al.
patent: 6057975 (2000-05-01), Yaeger et al.
patent: 6071007 (2000-06-01), Schaenzer et al.
patent: 6164118 (2000-12-01), Suzuki et al.
patent: 6185993 (2001-02-01), Schaenzer et al.
patent: 6239951 (2001-05-01), Wang et al.
patent: 6272909 (2001-08-01), Yao et al.
patent: 6293135 (2001-09-01), Marchon et al.
patent: 6452735 (2002-09-01), Egan et al.
patent: 6568252 (2003-05-01), Boutaghou
patent: 6577466 (2003-06-01), Meyer et al.
patent: 6619105 (2003-09-01), Yao et al.
patent: 6771453 (2004-08-01), Baumgartner et al.
patent: 6899456 (2005-05-01), Sundaram et al.
patent: 6963464 (2005-11-01), Xu et al.
patent: 6992850 (2006-01-01), Nishiyama
patent: 6999265 (2006-02-01), Schreck et al.
patent: 2003/0174430 (2003-09-01), Takahashi et al.
patent: 2006/0023354 (2006-02-01), Stipe
Kurita Masayuki
Pit Remmelt
Saegusa Shozo
Shiramatsu Toshiya
Suk Mike
Berthold Thomas R.
Hitachi Global Storage Technologies - Netherlands B.V.
Rogers David A.
LandOfFree
Glide-height disk-tester and method of operation does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Glide-height disk-tester and method of operation, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Glide-height disk-tester and method of operation will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3662480