Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-09-15
2008-11-25
Whitmore, Stacy A (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C703S022000, C717S136000
Reexamination Certificate
active
07458043
ABSTRACT:
Various approaches for generating input data for simulating a circuit design are disclosed. In one approach, a test generator program is generated from a main program that uses a test generator class library. The test generator class library includes a software driver class corresponding to the hardware driver, and the software driver class includes a storage class corresponding to each memory within the hardware driver, a first set including at least one method for writing function codes to a first object of the storage class, and a second set including at least one method for writing data to a second object of the storage class. Function codes are written to the first object of the storage class in response to a call by the test generator program to a method in the first set. Data of a first type is written to the second object of the storage class in response to a call by the test generator program to a method in the second set, wherein the data of the first type is data to be provided by the driver as input to the simulated circuit design.
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Cischke Christopher M.
Wise Ashley K.
Crawford & Maunu PLLC
Johnson Charles A.
Marley Robert
Unisys Corporation
Whitmore Stacy A
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