Generating pulses in analog channel of ATE tester

Details Generating pulses in analog channel of ATE tester Generating pulses in analog channel of ATE tester

1996-10-22

1999-06-29

Shah, Kamimi

Data processing: measuring, calibrating, or testing

Testing system

For transfer function determination

702 78, 364607, 371 277, 341152, G01R 3128

Patent

active

059181982

ABSTRACT:
A method simulating the filtering of a current pulse in a series of pulses. The method includes receiving a series of n+1 consecutive pulse addresses, including a pulse address for the current pulse as the last in the series of n+1, each pulse address being in a range of m values; storing the n pulses addresses prior to the current pulse address; building a composite address from the current pulse address and the prior n pulse addresses and applying the composite address to read a pulse shape from a memory of at least m.sup.n+1 pulse shapes. Also, apparatus issuing high speed pulses of programmable length. The apparatus includes a field of programmable memory to store a pulse length; a pulse clock line carrying a pulse clock signal having a pulse frequency; a frequency multiplier connected to receive the pulse clock signal and the pulse length stored in the programmable memory field and producing a sample clock signal having a frequency equal to the pulse length times the pulse clock frequency; a pulse memory holding the samples for a pulse; a DAC coupled to the pulse memory and generating analog pulses from samples received from the pulse memory; and a signal path carrying the sample clock signal to set the sampling frequency of a DAC and to clock samples from the pulse memory to the DAC.

REFERENCES:
patent: 5065370 (1991-11-01), Rizkowski et al.
patent: 5230008 (1993-07-01), Duch et al.
patent: 5309514 (1994-05-01), Johnson et al.
patent: 5644311 (1997-07-01), Choudhury et al.
patent: 5646521 (1997-07-01), Rosenthal et al.

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