Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-08-23
2005-08-23
Whitmore, Stacy A. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
06934930
ABSTRACT:
Generating an optical model includes receiving lens aberration data associated with a wafer response to lens aberrations. Aberration functions are selected and fit to the lens aberration data. An optical model is generated in accordance to the aberration functions, where the optical model indicates the wafer response to the lens aberrations.
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Blatchford, Jr. James W.
Flanagin Lewis W.
Brady III W. James
Lin Sun James
McLarty Peter K.
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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