Etching a substrate: processes – Gas phase etching of substrate – Application of energy to the gaseous etchant or to the...
Patent
1996-07-19
1998-09-29
Martin, Roland
Etching a substrate: processes
Gas phase etching of substrate
Application of energy to the gaseous etchant or to the...
216 37, 216 74, 216 77, 438694, 438715, 438717, B44C 122
Patent
active
058142398
ABSTRACT:
A gas-phase etchant is provided. The gas-phase etchant includes at least one halogen in gaseous form and/or at least one halogen halide in gaseous form. A Group III-nitride crystal is heated to a temperature in the range of 500.degree.-900.degree. C. and is etched in a flow of the gas-phase etchant. The gas-phase etchant may additionally include hydrogen. The gas-phase etchant may alternatively be diluted with inert gas, and the Group III-nitride crystal may be etched in a flow of the gas-phase etchant diluted with the inert gas.
REFERENCES:
patent: 5270263 (1993-12-01), Kim et al.
patent: 5535905 (1996-07-01), Harris et al.
patent: 5567659 (1996-10-01), Pakulski et al.
J.I. Pankove, "Electrolytic Etching of GaN", J. Electrochem. Soc. Solid-State Science and Technology, Aug. 1972, vol. 119, No. 8, pp. 1118-1119.
S.J. Pearton et al., "Low Bias Electron Cyclotron Resonance Plasma Etching of GaN, AIN, and InN", Appl. Phys. Lett. vol. 64, No. 17, Apr. 25, 1994, pp. 2294-2296.
Masaki Nagahara et al., "Selective Growth of Cubic GaN in Small Areas on Patterned GaAs(100) Substrate by Metalorganic Vapor Phase Epitaxy", Jpn. J. Appl. Phys. vol. 33, (1994), pp. 694-697.
H. Tsuchiya et al., "Homoepitaxial Growth of Cubic GaN by Hydride Vapor Phase Epitaxy on Cubic GaN/GaAs Substrates Prepared with GaAs Source Molecular Beam Epitaxy", Jpn. J. Appl. Phys., vol. 33, (1994) pp. 1747-1752.
K. Fuji et al., "Model for In-Situ Etching and Selective Epitaxy of AL.sub.x Ga.sub.1-.times. As with HCL Gas by Metalorganic Vapor Phase Epitaxy", J. Crystal Growth. vol. 145, (1994), pp. 277-282.
R.T. Leonard et al., Photoassisted Dry Etching of GaN, Appl Phys. Lett., vol. 68, Feb. 5, 1996, pp. 794-796.
Kaneko Yawara
Yamada Norihide
Hardcastle Ian
Hewlett--Packard Company
Martin Roland
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