GaN growth on Si using ZnO buffer layer

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Compound semiconductor

Reexamination Certificate

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C438S093000, C438S104000

Reexamination Certificate

active

07001791

ABSTRACT:
A method for forming group III-N articles includes the steps of providing a single crystal silicon substrate, depositing a zinc oxide (ZnO) layer on the substrate, and depositing a single crystal group III-N layer on the ZnO layer. At least a portion of the group III-N layer is deposited at a temperature of less than 600° C.

REFERENCES:
patent: 6030886 (2000-02-01), Yuri et al.
patent: 2002/0086534 (2002-07-01), Cuomo et al.
Pearton et al., “GaN: Processing, defects, and devices,” Journal of Applied Physics, 86:1-78, 1999.
Pearton et al., “Fabrication and performance of GaN electronic devices,” Materials Science and Engineering: R: Reports, 30:1-137, 2000.
Kim et al., “Growth of high-quality GaN on Si(111) substrate by ultrahigh vacuum chemical vapor deposition,” Applied Physics Letters, 78:2858-2860, 2001.
Krost et al., “GaN-Based Devices on Si,” Phys. Stat. Sol., 194:361-375, 2002.
Wang et al., “Growth of hexagonal GaN on Si(111) coated with a thin flat SiC buffer layer,” Applied Physics Letters, 77:1846-1848, 2000.
Zamir, “The effect of AIN buffer layer on GaN grown on (111)-oriented Si substrates by MOCVD,” Journal of Crystal Growth, 218:181-190, 2000.
Ueda et al., “Vapor phase epitaxy growth of GaN on pulsed laser deposited ZnO buffer layer,” Journal of Crystal Growth, 187:340-346, 1998.
Gu et al., “Role of Interfacial compound formation associated with the use of ZnO buffers layers in the hydride vapor phase epitaxy of GaN,” Applied Physics Letters, 76:3454-3456, 2000.
Molnar et al., “Growth of gallium nitride by hydride vapor-phase epitaxy,” Journal of Crystal Growth, 178:147-156, 1997.
Detchprohm et al., “Hyride vapor phase epitaxial growth of a high quality GaN film using a ZnO buffer layer,” Appl. Phys. Lett., 61:2688-2690, 1992.
Strittmatter et al., “LP-MOCVD growth of GaN on silicon substrates-comparison between A1As and ZnO nucleation layers,” Materials Science and Engineering, 59:29-32, 1999.
Lee et al., “The Application of a Low Temperature GaN Buffer Layer to Thick GaN Film Growth on ZnO/Si Substrate,” Phys. Stat. Sol., 176:583-587, 1999.
Dehoff, R., “Thermodynamics in Materials Science,” McGraw Hill, 326-327, 1993.
Molnar et al., “Gallium Nitride Thick Films Grown by Hydride Vapor Phase Epitaxy,” Mat. Res. Soc. Symp., 423:221-226, 1996.

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