Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making
Patent
1994-12-19
1996-09-10
Grimley, Arthur T.
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Radiation sensitive composition or product or process of making
355 71, 430906, 430907, G03F 7004
Patent
active
055544843
ABSTRACT:
Fine, sub-micron line features and patterns are created in a radiation sensitive resist layer on a semiconductor wafer by a beam of short wavelength gamma rays. The resist layer includes photoresist which is substantially chemically inactive in response to the gamma rays. The photoresist is either doped or covered with a material that absorbs gamma rays and in response emits secondary radiation of a different wavelength, preferably photons, that is actinic with respect to the photoresist. The resist layer enables using radiation sources having better resolving ability than conventional photolithographic sources to perform near-field and direct-write lithography.
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Pasch Nicholas F.
Rostoker Michael D.
Zelayeta Joe
Grimley Arthur T.
Kerner Herbert
LSI Logic Corporation
Taylor John P.
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