Semiconductor device manufacturing: process – Introduction of conductivity modifying dopant into... – Ion implantation of dopant into semiconductor region
Reexamination Certificate
2011-01-04
2011-01-04
Ngo, Ngan (Department: 2893)
Semiconductor device manufacturing: process
Introduction of conductivity modifying dopant into...
Ion implantation of dopant into semiconductor region
C438S570000, C438S092000, C257SE21368, C257SE21359, C257SE21351
Reexamination Certificate
active
07863172
ABSTRACT:
A gallium nitride based semiconductor Schottky diode fabricated from a n+ doped GaN layer having a thickness between one and six microns disposed on a sapphire substrate; an n− doped GaN layer having a thickness greater than one micron disposed on said n+ GaN layer patterned into a plurality of elongated fingers and a metal layer disposed on the n− doped GaN layer and forming a Schottky junction therewith. The layer thicknesses and the length and width of the elongated fingers are optimized to achieve a device with breakdown voltage of greater than 500 volts, current capacity in excess of one ampere, and a forward voltage of less than three volts.
REFERENCES:
patent: 3775200 (1973-11-01), De Nobel et al.
patent: 4543595 (1985-09-01), Vora
patent: 4745445 (1988-05-01), Mun et al.
patent: 4946547 (1990-08-01), Palmour et al.
patent: 5200022 (1993-04-01), Kong et al.
patent: RE34861 (1995-02-01), Davis et al.
patent: 5602418 (1997-02-01), Imai et al.
patent: 5612567 (1997-03-01), Baliga
patent: 5686738 (1997-11-01), Moustakas
patent: 5741724 (1998-04-01), Ramdani et al.
patent: 5785606 (1998-07-01), Marquez
patent: 5874747 (1999-02-01), Redwing et al.
patent: 5877558 (1999-03-01), Nakamura et al.
patent: 6121121 (2000-09-01), Koide
patent: 6139628 (2000-10-01), Yuri et al.
patent: 6146457 (2000-11-01), Solomon
patent: 6184570 (2001-02-01), MacDonald, Jr. et al.
patent: 6239033 (2001-05-01), Kawai
patent: 6331450 (2001-12-01), Uemura
patent: 6344665 (2002-02-01), Sung et al.
patent: 6380108 (2002-04-01), Linthicum et al.
patent: 6389051 (2002-05-01), Van de Walle
patent: 6437374 (2002-08-01), Northrup et al.
patent: 6507041 (2003-01-01), Nakamura et al.
patent: 6524900 (2003-02-01), Dahlqvist et al.
patent: 6573537 (2003-06-01), Steigerwald et al.
patent: 6586777 (2003-07-01), Yuasa et al.
patent: 6586781 (2003-07-01), Wu et al.
patent: 6593597 (2003-07-01), Sheu
patent: 6605854 (2003-08-01), Nagase et al.
patent: 6608327 (2003-08-01), Davis et al.
patent: 6610995 (2003-08-01), Nakamura et al.
patent: 6624444 (2003-09-01), Li
patent: 6627967 (2003-09-01), Asano et al.
patent: 6649995 (2003-11-01), Tooi et al.
patent: 6656823 (2003-12-01), Lee et al.
patent: 6768146 (2004-07-01), Yoshida
patent: 6855970 (2005-02-01), Hatakeyama et al.
patent: 6949401 (2005-09-01), Kaminski et al.
patent: 6949774 (2005-09-01), Parikh et al.
patent: 7115896 (2006-10-01), Gao et al.
patent: 7229866 (2007-06-01), Zhu et al.
patent: 7253015 (2007-08-01), Pophristic et al.
patent: 7323402 (2008-01-01), Chiola
patent: 2003/0015708 (2003-01-01), Parikh et al.
patent: 2003/0098462 (2003-05-01), Yoshida
patent: 2004/0119063 (2004-06-01), Guo et al.
patent: 2006/0151868 (2006-07-01), Zhu et al.
patent: 0081414 (1983-06-01), None
patent: 0514018 (1992-11-01), None
patent: 2844099 (2004-03-01), None
patent: 11040847 (1999-02-01), None
patent: 11145514 (1999-05-01), None
patent: 96/41906 (1996-12-01), None
patent: 01/43174 (2001-06-01), None
European Search Report for EP 06250065, dated Apr. 17, 2008.
Hunter, L.P., “Physics of Semiconductor Materials, Devices, and Circuits Handbook of Semiconductor Electronics,” pp. 1-10 (1970).
Sugimura et al.. “I-V Characteristics of Schottky/Metal-Insulator-Semiconductor Diodes with Tunnel Thin Barriers,” Jpn. J. Appl. Phys. vol. 39, Part 1, No. 7B, pp. 4521-4522 (Jul. 2000).
Yanagihara, et al., “Development of GaN-Based Electronic Device on Si,” Sanken Technical Report, vol. 35, No. 1 pp. 11-14 (2003). (English—language translation of Japanese—language publication).
Zhu, T.G. et al., “High-Voltage Mesa Structure GaN Schottky Rectifiers Processed by Dry and Wet Etching,” Applied Physics Letters, AIP, American Institute of Physics, Melville, NY, vol. 77, No. 18 (Oct. 30, 2000).
Zhang et al., “Comparison of GaN P-I-N and Schottky Rectifier Performance,” IEEE Trans. On Electronic Devices, vol. 4 No. 3, pp. 407-411 (Mar. 2001).
Gottfried Mark
Liu Linlin
Murphy Michael
Pabisz Marek K.
Pophristic Milan
Liu Benjamin Tzu-Hung
Ngo Ngan
Power Integrations, Inc.
The Law Offices of Bradley J. Bereznak
LandOfFree
Gallium nitride semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Gallium nitride semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Gallium nitride semiconductor device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2733697