Fuse monitoring circuit for semiconductor memory device

Details Fuse monitoring circuit for semiconductor memory device Fuse monitoring circuit for semiconductor memory device

2011-04-12

2011-04-12

Nguyen, Tuan T (Department: 2824)

Static information storage and retrieval

Read/write circuit

Having fuse element

C365S189060, C365S189080

Reexamination Certificate

active

07924646

ABSTRACT:
A fuse monitoring circuit for a semiconductor memory device includes a fuse repair unit including a plurality of fuses each programmed with at least one repair address, configured to receive a fuse reset signal and to output a plurality of fuse state signals each corresponding to a connection state of one of the fuses, a fuse monitoring unit configured to receive a monitoring enable signal and to output a plurality of fuse state monitoring signals each corresponding to a corresponding one of the fuse state signals, each of the fuse state signals corresponding to one of a plurality of addresses, and an output unit configured to receive an output control signal and to output the fuse state monitoring signals to an output pad.

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Notice of Prelimary Rejection issued from Korean Intellectual Property Office on Apr. 24, 2009 with an Enligh Translation.
Notice of Allowance issued from Korean Intellectual Property Office on Sep. 1, 2009 with an Enligh Translation.

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