Miscellaneous active electrical nonlinear devices – circuits – and – Specific identifiable device – circuit – or system – Fusible link or intentional destruct circuit
Reexamination Certificate
2006-06-13
2006-06-13
Vu, Phuong T. (Department: 2836)
Miscellaneous active electrical nonlinear devices, circuits, and
Specific identifiable device, circuit, or system
Fusible link or intentional destruct circuit
Reexamination Certificate
active
07061304
ABSTRACT:
A fuse latch circuit with a current reference generator is described where the resistive switch point of the latch is stabilized against effects of manufacturing processing, operating voltage and temperature. A digital control word is used to select the desired resistive trip point of the fuse latch and compensation within the reference generator maintains this resistive trip point with high accuracy. The variable resistive trip point is set to a first value at test and then to a second value in use condition to enhance operating margin, and soft error immunity.
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Anand Darren L.
Fifield John A.
Bauer Scott
International Business Machines - Corporation
LeStrange Michael J.
Vu Phuong T.
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