Fuse latch with compensated programmable resistive trip point

Miscellaneous active electrical nonlinear devices – circuits – and – Specific identifiable device – circuit – or system – Fusible link or intentional destruct circuit

Reexamination Certificate

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Reexamination Certificate

active

07061304

ABSTRACT:
A fuse latch circuit with a current reference generator is described where the resistive switch point of the latch is stabilized against effects of manufacturing processing, operating voltage and temperature. A digital control word is used to select the desired resistive trip point of the fuse latch and compensation within the reference generator maintains this resistive trip point with high accuracy. The variable resistive trip point is set to a first value at test and then to a second value in use condition to enhance operating margin, and soft error immunity.

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patent: 6400202 (2002-06-01), Fifield et al.

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