Fuse latch circuit with non-disruptive re-interrogation

Details Fuse latch circuit with non-disruptive re-interrogation Fuse latch circuit with non-disruptive re-interrogation

2005-12-06

2005-12-06

Nguyen, Minh (Department: 2816)

Miscellaneous active electrical nonlinear devices, circuits, and

Specific identifiable device, circuit, or system

Fusible link or intentional destruct circuit

C365S200000, C365S225700

Reexamination Certificate

active

06972613

ABSTRACT:
Information concerning a condition of a fuse is stored in a latch circuit and may be corrected. A first signal is supplied to the latch circuit which sets the latch circuit in a first state when the fuse is in a first condition and keeps the latch circuit unchanged when the fuse is in a second condition. While the first signal is being supplied, a second signal is supplied to the latch circuit that keeps the latch circuit in the first state when the fuse is in the first condition and sets the latch circuit in a second state when the fuse is in the second condition.

REFERENCES:
patent: 5345110 (1994-09-01), Renfro et al.
patent: 5619469 (1997-04-01), Joo
patent: 5723999 (1998-03-01), Merritt
patent: 5905687 (1999-05-01), Brede et al.
patent: 6016265 (2000-01-01), Yoshida et al.
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patent: 6384666 (2002-05-01), Bertin et al.
patent: 6552946 (2003-04-01), Yokozeki
patent: 6707746 (2004-03-01), Frankowsky et al.
patent: 6728148 (2004-04-01), Yamauchi

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