Fuse circuit for semiconductor integrated circuit

Details Fuse circuit for semiconductor integrated circuit Fuse circuit for semiconductor integrated circuit

2005-01-04

2005-01-04

Nguyen, Minh (Department: 2816)

Miscellaneous active electrical nonlinear devices, circuits, and

Specific identifiable device, circuit, or system

Fusible link or intentional destruct circuit

C365S225700

Reexamination Certificate

active

06838926

ABSTRACT:
In a fuse circuit including programmable fuses in a semiconductor integrated circuit, the fuses store specific information related to the semiconductor integrated circuit, such as redundancy information, wafer lot number, die lot number, and die position on the wafer, etc. The fuse circuit utilizes a plurality of fuses for storing identical bit information. Consequently, in the case where a fuse has not been cut out correctly, the fuse circuit can reduce programming defects, whereby defect generation rates are remarkably decreased.

REFERENCES:
patent: 5469388 (1995-11-01), Park
patent: 5469391 (1995-11-01), Haraguchi
patent: 5517151 (1996-05-01), Kubota
patent: 5576999 (1996-11-01), Kim et al.
patent: 5677917 (1997-10-01), Wheelus et al.
patent: 5933382 (1999-08-01), Yi et al.
patent: 6026037 (2000-02-01), Hong

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