Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2008-11-06
2011-11-01
Elms, Richard (Department: 2824)
Static information storage and retrieval
Read/write circuit
Testing
C365S200000, C365S225700
Reexamination Certificate
active
08050122
ABSTRACT:
A fuse apparatus for controlling a built-in self stress unit includes a built-in self stress configured to repeatedly generate any stress test pattern in a test mode, and generate a one-cycle end signal when one cycle for the generated stress test pattern has ended, and a fuse configured to record an operation state of the built-in self stress according to the one-cycle end signal. A method for controlling a built-in self stress includes repeatedly generating any stress test mode, in a test mode counting the generated stress test pattern, and activating a cycle end signal when a counting value reaches a predetermined value, and recording an operation state of the built-in self stress in a fuse on the basis of the counted value.
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Notice of Allowance issued from Korean Intellectual Property Office on Aug. 7, 2009 with an English Translation.
Hiroshi Ito, et al.,“Pure CMOS One-time Programmable Memory using Gate-Ox Anti-fuse,” IEEE 2004 Custom Integrated Circuits Conference, 2004, pp. 469-472, IEEE.
Elms Richard
Hynix / Semiconductor Inc.
IP & T Group LLP
Nguyen Hien N
LandOfFree
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