Functional tester for integrated circuits

Details Functional tester for integrated circuits Functional tester for integrated circuits

1995-10-18

2000-02-29

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324765, G01R 3102

Patent

active

06031382&

ABSTRACT:
A tester for integrated circuits, includes a testing set for supplying inputs for operating an integrated circuit to be tested and for measuring outputs of the integrated circuit to be tested, a semiconductor chip or wafer formed with at least some of the functions of the testing set, and a contact member through which the semiconductor chip or wafer is to come into electrical contact with the integrated circuit to be tested. Thus, it is not necessary to transmit test signals from the testing set, and hence it is possible to simplify the expensive hardware necessary for transmitting the test signals. As a result, the cost of the tester is markedly reduced.

REFERENCES:
patent: 5020219 (1991-06-01), Leedy
patent: 5023545 (1991-06-01), Marques
patent: 5177439 (1993-01-01), Liu et al.
patent: 5206582 (1993-04-01), Ekstedt et al.
patent: 5420520 (1995-05-01), Anschel et al.

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