Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate
2005-09-20
2005-09-20
Decady, Albert (Department: 2133)
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
C714S733000
Reexamination Certificate
active
06948096
ABSTRACT:
A functional random instruction testing (FRIT) method is provided for testing complex devices. The method comprises the steps of: generating a FRIT kernel which includes a software built-in self-test engine (SBE) configured to execute a re-generative functional test of the complex device under test (DUT), and an expected test result obtained from computer modeling of a complex device under test (DUT) or from a known good device; converting the FRIT kernel into kernel test patterns and storing the kernel test patterns in a tester memory; loading, at the tester, the kernel test patterns stored in the tester memory onto an on-board memory of the complex device under test (DUT), via an interface; executing, at the complex device under test (DUT), a re-generative functional test of the complex device under test (DUT) by applying the kernel test patterns to the complex device under test (DUT); and comparing, at the tester, a test result of the re-generative functional test with a test expected result to check for manufacturing defects.
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Lindsay William C.
Maneparambil Kailasnath
Parvathala Praveen K.
De'cady Albert
Intel Corporation
LeMoine Patent Services, PLLC
Tabone, Jr. John J.
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