Functional cells for automated I/O timing characterization...

Details Functional cells for automated I/O timing characterization... Functional cells for automated I/O timing characterization...

2005-08-30

2008-03-25

Cho, James (Department: 2819)

Electronic digital logic circuitry

Multifunctional or programmable

Array

C326S093000

Reexamination Certificate

active

07348797

ABSTRACT:
Hardware cells inside of an IC device, such as in a processor circuit, for characterization that replace functional flip-flops that capture inputs or drive outputs in the device. The cells are circuits that are used, in conjunction with a software method, to generate test programs for testing exact I/O transitions for timing measurements at various operating conditions.

REFERENCES:
patent: 5649176 (1997-07-01), Selvidge et al.
patent: 6266801 (2001-07-01), Jin
patent: 6446230 (2002-09-01), Chung
patent: 6658632 (2003-12-01), Parulkar et al.
patent: 2007/0050737 (2007-03-01), Weinraub

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