Function verification method

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000

Reexamination Certificate

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11117483

ABSTRACT:
A function verification method comprises preparing a first function block that can execute the required functions in a semiconductor integrated circuit, preparing a second function block to be a verification target having a substantially identical configuration as the first function block and verifying functions of the second function block using the first function block.

REFERENCES:
patent: 6449750 (2002-09-01), Tsuchiya
patent: 6701504 (2004-03-01), Chang et al.
patent: 2001/0027539 (2001-10-01), Nozuyama
patent: 2002/0108056 (2002-08-01), Hatakeyama
patent: 2005/0004777 (2005-01-01), Houlihane
“Reuse Methodology Manual, Chapter 11, System-Level Verification Issues,” 3rdEdition, 2002, Kluwer Academic Publishers, ISBN 1-4020-7141-8, pp. 239-263.
“Nikkei Microdevices”, Jan. 2003 Edition, pp. 146-149.
“Nikkei Microdevices”, Feb. 2003 Edition, pp. 133-136.
“Nikkei Microdevices”, Mar. 2003 Edition, pp. 126-130.

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