Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-05-01
2007-05-01
Lin, Sun James (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
11117483
ABSTRACT:
A function verification method comprises preparing a first function block that can execute the required functions in a semiconductor integrated circuit, preparing a second function block to be a verification target having a substantially identical configuration as the first function block and verifying functions of the second function block using the first function block.
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“Reuse Methodology Manual, Chapter 11, System-Level Verification Issues,” 3rdEdition, 2002, Kluwer Academic Publishers, ISBN 1-4020-7141-8, pp. 239-263.
“Nikkei Microdevices”, Jan. 2003 Edition, pp. 146-149.
“Nikkei Microdevices”, Feb. 2003 Edition, pp. 133-136.
“Nikkei Microdevices”, Mar. 2003 Edition, pp. 126-130.
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