Fully siliciding regions to improve performance

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S296000, C257SE21266

Reexamination Certificate

active

07550808

ABSTRACT:
Structures and related methods including fully silicided regions are disclosed. In one embodiment, a structure includes a substrate; a partially silicided region located in an active region of an integrated circuit formed on the substrate; a fully silicided region located in a non-active region of the integrated circuit, and wherein the partially and fully silicided regions are formed from a common semiconductor layer.

REFERENCES:
patent: 5268330 (1993-12-01), Givens et al.
patent: 6160291 (2000-12-01), Imai
patent: 6437404 (2002-08-01), Xiang et al.
patent: 6613614 (2003-09-01), Yamazaki et al.
patent: 7033868 (2006-04-01), Nakamura et al.
patent: 7238569 (2007-07-01), Torii
patent: 2005/0156238 (2005-07-01), Wen et al.
patent: 2005/0250287 (2005-11-01), Chen et al.
patent: 2006/0125040 (2006-06-01), Levin et al.
patent: 2006/0175649 (2006-08-01), Bhattacharyya
patent: 2007/0170543 (2007-07-01), Furukawa et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Fully siliciding regions to improve performance does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Fully siliciding regions to improve performance, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Fully siliciding regions to improve performance will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4064972

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.