Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-08-15
2006-08-15
Booth, Richard A. (Department: 2812)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C438S954000, C438S283000
Reexamination Certificate
active
07091551
ABSTRACT:
A four-bit FinFET memory cell, method of fabricating four-bit FinFET memory cell and an NVRAM formed of four-bit FINFET memory cells. The four-bit memory cell including two charge storage regions in opposite ends of a dielectric layer on a first sidewall of a fin of a FinFET and two additional charge storage regions in opposite ends of a dielectric layer on a second sidewall of the fin of the FinFET, the first and second sidewalls being opposite one another.
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Alberts et al.; Multi-Bit Fet EAROM Cell; IBM Technical Disclosure Bulletin, vol. 24, No. 7A, Dec. 1981; pp. 3311-3314.
Anderson Brent A.
Clark, Jr. William F.
Nowak Edward J.
Booth Richard A.
International Business Machines - Corporation
Sabo William D.
Schmeiser Olsen & Watts
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