Forming method and forming system for insulation film

Adhesive bonding and miscellaneous chemical manufacture – Differential fluid etching apparatus – Having glow discharge electrode gas energizing means

Reexamination Certificate

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C438S216000, C438S261000, C438S287000, C438S421000, C438S591000, C438S595000, C438S954000, C438S981000, C438S778000, C438S788000, C438S792000

Reexamination Certificate

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11636695

ABSTRACT:
A gate insulation film (104) of a MISFET (100) is constituted of a silicon oxide film (106), silicon nitride film (107), and high-permittivity film (108). The silicon oxide film (106) and silicon nitride film (107) are formed by microwave plasma processing with a radial line slot antenna.

REFERENCES:
patent: 6020243 (2000-02-01), Wallace et al.
patent: 6072221 (2000-06-01), Hieda
patent: 6158383 (2000-12-01), Watanabe et al.
patent: 6399520 (2002-06-01), Kawakami et al.
patent: 2002/0014666 (2002-02-01), Ohmi et al.
patent: 11293470 (1999-10-01), None
patent: 2000294550 (2000-10-01), None
patent: 2001-160555 (2001-06-01), None
patent: WO 00/01008 (2000-01-01), None
European Search Report dated Oct. 6, 2005 (Three (3) Pages).

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