Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate
Reexamination Certificate
2006-08-15
2006-08-15
Le, Dung A. (Department: 2818)
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
Insulative material deposited upon semiconductive substrate
C438S779000, C438S762000, C427S588000
Reexamination Certificate
active
07091138
ABSTRACT:
A forming method and a forming apparatus of nanocrystalline silicon structure makes it possible to prepare a nanocrystalline silicon structure at a low temperature to have densely packed silicon crystal grains which are stably terminated and to effectively control the grain size in nanometer scale. A forming method and a forming apparatus of nanocrystalline silicon structure with oxide or nitride termination, carry out a first step of treating a surface of a substrate with hydrogen radical; a second step of depositing silicon crystals having a grain size of 10 nm or less by the thermal reaction of a silicon-containing gas; and a third step of terminating the surface of the silicon crystal with oxygen or nitrogen by using one of oxygen gas, oxygen radical and nitrogen radical.
REFERENCES:
patent: 6706336 (2004-03-01), Kondo et al.
patent: 2000-273450 (2000-10-01), None
patent: 2003-086093 (2003-03-01), None
Koshida Nobuyoshi
Numasawa Yoichiro
Anelva Corporation
Buchanan & Ingersoll PC
Koshida Nobuyoshi
Le Dung A.
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