Formation method of metallic compound layer, manufacturing...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C257SE21165

Reexamination Certificate

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07968463

ABSTRACT:
A formation method of a metallic compound layer includes preparing, in a chamber, a substrate having a surface on which a semiconductor material of silicon, germanium, or silicon germanium is exposed, and forming a metallic compound layer, includes: supplying a raw material gas containing a metal for forming a metallic compound with the semiconductor material to the chamber; heating the substrate to a temperature at which the raw material gas is pyrolyzed; and forming a metallic compound layer by reaction of the metal with the semiconductor material so that no layer of the metal is deposited on the substrate. A manufacturing method of a semiconductor device employs this formation method of a metallic compound layer.

REFERENCES:
patent: 4684542 (1987-08-01), Jasinski et al.
patent: 4756927 (1988-07-01), Black et al.
patent: 5459099 (1995-10-01), Hsu
patent: 6004872 (1999-12-01), Tezuka et al.
patent: 6291346 (2001-09-01), Tai
patent: 7226827 (2007-06-01), Schram et al.
patent: 2005/0059243 (2005-03-01), Schram et al.
patent: 2005/0145943 (2005-07-01), Schram et al.
patent: 2006/0030161 (2006-02-01), Machida et al.
patent: 2007/0215951 (2007-09-01), Schram et al.
patent: 5-144747 (1993-06-01), None
patent: 6-318563 (1994-11-01), None
patent: 7-297136 (1995-11-01), None
patent: 8-97249 (1996-04-01), None
patent: 8-139030 (1996-05-01), None
patent: 8-283944 (1996-10-01), None
patent: 10-144625 (1998-05-01), None
patent: 2000-58484 (2000-02-01), None
patent: 2000-133617 (2000-05-01), None
patent: 2003-328130 (2003-11-01), None
patent: 2005-93732 (2005-04-01), None
patent: 2005-123625 (2005-05-01), None
patent: 2006-45649 (2006-02-01), None
patent: 2006-179874 (2006-07-01), None
Hsu et al. ‘Selective area platinum silicide film deposition using a molecular precursor chemical beam source’ : Thin Solid Films vol. 269 (1995), p. 21-28, full text, Fig.1-8.
Ishikawa et al. ‘Ni Precursor for Chemical Vapor Deposition of NiSi’ : Jpn. J. Appl. Phys., vol. 43,No. 4B(2004), p. 1833-1836, full text, Fig.1-8.
Ann Lauwers, et al. “Materials aspects, electrical performance, and scalability of Ni silicide towards sub-0.13 um technologies”, J. Vac. Sci. Technol. B 19(6), Nov./Dec. 2001, pp. 2026-2037.
A. Vantomme, et al., “Concentration-controlled phase selection of silicide formation, during reactive deposition”, Applied Physics Letters, vol. 74, No. 21, May 22, 1999, pp. 3137-3139.
D. Hesse, et al. “Electron Microscopy Evidence of Interfacial Steps Controlling the Kinetics of NiSi2 Formation”, Mat. Res. Soc. Symp. Proc., vol. 320., 1994, pp. 221-226.
Masato Ishikawa, et al., “Composition control of Ni-silicide by CVD using Ni(PF3)4 and Si3Hs”, International Conference On Solid State Devices and Materials, Kobe, 2005, pp. 508-509.
Seiji Motojima, et al., Preparation and Properties of Nickel Silicide Layers by the Diffusion and CVD Processes Using Si2Cl6as a Source of Silicon, Journal of Materials Science 22 (1987) 547-553.

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