Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2008-06-10
2008-06-10
Tsai, Carol S (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S064000, C702S066000, C702S067000, C702S068000, C702S069000, C702S182000, C375S232000, C375S355000, C382S181000
Reexamination Certificate
active
07386406
ABSTRACT:
An original composite eye diagram is reformulated by deliberately re-aligning its component eye diagrams according to some appropriate standard. This ‘forced-alignment’ shifts the components in one or both of the time and voltage axes. Notice is taken of the shift(s) for each channel, and that shift data is appended to the data structures for the original components. The content of the data structure can be read in its original form, or, read and force-aligned. A force-aligned composite eye diagram created from the re-aligned components can then be displayed, investigated and evaluated with any of the existing tools that used to analyze eye diagrams, simply by instructing the process that read a component eye diagram structure to reform that component as it is being read.
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Agilent Technologie,s Inc.
Tsai Carol S
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