Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate
2007-10-02
2007-10-02
Pham, Hoa Q. (Department: 2886)
Optics: measuring and testing
By polarized light examination
Of surface reflection
Reexamination Certificate
active
11105852
ABSTRACT:
A substantially self-contained “on-board” material system investigation system functionally mounted on a three dimensional locational system to enable positioning at desired locations on, and distances from, the surface of a large sample, including the capability to easily and conveniently change the angle-of-incidence of a beam of electromagnetic radiation onto a sample surface.
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Goeden Christopher A.
He Ping
Johs Blaine D.
Liphardt Martin M.
Welch James D.
J.A. Woollan Co., Inc.
Pham Hoa Q.
Welch James D.
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